Yoshiki Kakuta, Reika Kinoshita, Hiroshi Kinoshita, Chihiro Matsui, Ken Takeuchi. Real-time Error Monitoring System Considering Endurance and Data-retention Characteristics of TaOX-based ReRAM Storage with Workloads at Data Centers. In 2020 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2020, Hsinchu, Taiwan, August 10-13, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.