Florian Kälber, Okan Köpüklü, Nicolas H. Lehment, Gerhard Rigoll. U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors. In Giovanni Maria Farinella, Petia Radeva, José Braz, Kadi Bouatouch, editors, Proceedings of the 16th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2021, Volume 5: VISAPP, Online Streaming, February 8-10, 2021. pages 593-601, SCITEPRESS, 2021. [doi]
Abstract is missing.