New Metrics to Evaluate Pattern Recognition in Remote Sensing Images

Manel Kallel, Mohamed Naouai, Yosr Slama. New Metrics to Evaluate Pattern Recognition in Remote Sensing Images. In Luis Álvarez, Marta Mejail, Luis Gómez, Julio C. Jacobo, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 17th Iberoamerican Congress, CIARP 2012, Buenos Aires, Argentina, September 3-6, 2012. Proceedings. Volume 7441 of Lecture Notes in Computer Science, pages 664-673, Springer, 2012. [doi]

Abstract

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