Emmanouil Kalligeros, D. Kaseridis, Xrysovalantis Kavousianos, Dimitris Nikolos. Reseeding-Based Test Set Embedding with Reduced Test Sequences. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 226-231, IEEE Computer Society, 2005. [doi]
@inproceedings{KalligerosKKN05,
title = {Reseeding-Based Test Set Embedding with Reduced Test Sequences},
author = {Emmanouil Kalligeros and D. Kaseridis and Xrysovalantis Kavousianos and Dimitris Nikolos},
year = {2005},
doi = {10.1109/ISQED.2005.105},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.105},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/KalligerosKKN05},
cites = {0},
citedby = {0},
pages = {226-231},
booktitle = {6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2301-3},
}