Emmanouil Kalligeros, D. Kaseridis, Xrysovalantis Kavousianos, Dimitris Nikolos. Reseeding-Based Test Set Embedding with Reduced Test Sequences. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 226-231, IEEE Computer Society, 2005. [doi]
Abstract is missing.