Vijay Kiran Kalyanam, Eric Mahurin, Keith A. Bowman, Jacob A. Abraham. A Proactive System for Voltage-Droop Mitigation in a 7-nm Hexagon™ Processor. J. Solid-State Circuits, 56(4):1166-1175, 2021. [doi]
@article{KalyanamMBA21a,
title = {A Proactive System for Voltage-Droop Mitigation in a 7-nm Hexagon™ Processor},
author = {Vijay Kiran Kalyanam and Eric Mahurin and Keith A. Bowman and Jacob A. Abraham},
year = {2021},
doi = {10.1109/JSSC.2020.3043786},
url = {https://doi.org/10.1109/JSSC.2020.3043786},
researchr = {https://researchr.org/publication/KalyanamMBA21a},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {56},
number = {4},
pages = {1166-1175},
}