A multi-disciplinary study of vibration based reliability of lead-free electronic interconnects

E. Kamara, H. Lu, C. Bailey, C. Hunt, D. Di Maio, O. Thomas. A multi-disciplinary study of vibration based reliability of lead-free electronic interconnects. Microelectronics Reliability, 50(9-11):1706-1710, 2010. [doi]

Abstract

Abstract is missing.