A Variation-Aware MTJ Store Energy Estimation Model for Edge Devices With Verify-and-Retryable Nonvolatile Flip-Flops

Aika Kamei, Hideharu Amano, Takuya Kojima, Daiki Yokoyama, Kimiyoshi Usami, Keizo Hiraga, Kenta Suzuki, Kazuhiro Bessho. A Variation-Aware MTJ Store Energy Estimation Model for Edge Devices With Verify-and-Retryable Nonvolatile Flip-Flops. IEEE Trans. VLSI Syst., 31(4):532-542, April 2023. [doi]

@article{KameiAKYUHSB23,
  title = {A Variation-Aware MTJ Store Energy Estimation Model for Edge Devices With Verify-and-Retryable Nonvolatile Flip-Flops},
  author = {Aika Kamei and Hideharu Amano and Takuya Kojima and Daiki Yokoyama and Kimiyoshi Usami and Keizo Hiraga and Kenta Suzuki and Kazuhiro Bessho},
  year = {2023},
  month = {April},
  doi = {10.1109/TVLSI.2023.3237794},
  url = {https://doi.org/10.1109/TVLSI.2023.3237794},
  researchr = {https://researchr.org/publication/KameiAKYUHSB23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {31},
  number = {4},
  pages = {532-542},
}