Bozena Kaminska, Stephen K. Sunter, Salvador Mir. Analog and mixed signal test techniques for SOC development. Microelectronics Journal, 36(12):1063, 2005. [doi]
@article{KaminskaSM05,
title = {Analog and mixed signal test techniques for SOC development},
author = {Bozena Kaminska and Stephen K. Sunter and Salvador Mir},
year = {2005},
doi = {10.1016/j.mejo.2005.06.002},
url = {http://dx.doi.org/10.1016/j.mejo.2005.06.002},
tags = {testing},
researchr = {https://researchr.org/publication/KaminskaSM05},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {36},
number = {12},
pages = {1063},
}