Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering - researchr publication authors

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Markus Kammerstetter, Markus Muellner, Daniel Burian, Christian Platzer, Wolfgang Kastner. Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering. In Gail-Joon Ahn, Moti Yung, Ninghui Li, editors, Proceedings of the 2014 ACM SIGSAC Conference on Computer and Communications Security, Scottsdale, AZ, USA, November 3-7, 2014. pages 549-557, ACM, 2014. [doi]

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