Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering

Markus Kammerstetter, Markus Muellner, Daniel Burian, Christian Platzer, Wolfgang Kastner. Breaking Integrated Circuit Device Security through Test Mode Silicon Reverse Engineering. In Gail-Joon Ahn, Moti Yung, Ninghui Li, editors, Proceedings of the 2014 ACM SIGSAC Conference on Computer and Communications Security, Scottsdale, AZ, USA, November 3-7, 2014. pages 549-557, ACM, 2014. [doi]

Abstract

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