Erik Kamsties, Christopher M. Lott. An Empirical Evaluation of Three Defect-Detection Techniques. In Wilhelm Schäfer, Pere Botella, editors, 5th European Software Engineering Conference, Sitges, Spain, September 25-28, 1995, Proceedings. Volume 989 of Lecture Notes in Computer Science, pages 362-383, Springer, 1995.
Abstract is missing.