Potential of Fault-Detection Coverage by means of On-Chip Redundancy - IEC61508: Are There Royal Roads to SIL 4?

Nobuyasu Kanekawa. Potential of Fault-Detection Coverage by means of On-Chip Redundancy - IEC61508: Are There Royal Roads to SIL 4?. IEICE Transactions, 96-D(9):1907-1913, 2013. [doi]

Abstract

Abstract is missing.