Mineo Kaneko. Timing-test scheduling for constraint-graph based post-silicon skew tuning. In 30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada, September 30 - Oct. 3, 2012. pages 460-465, IEEE Computer Society, 2012. [doi]
@inproceedings{Kaneko12,
title = {Timing-test scheduling for constraint-graph based post-silicon skew tuning},
author = {Mineo Kaneko},
year = {2012},
doi = {10.1109/ICCD.2012.6378679},
url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2012.6378679},
researchr = {https://researchr.org/publication/Kaneko12},
cites = {0},
citedby = {0},
pages = {460-465},
booktitle = {30th International IEEE Conference on Computer Design, ICCD 2012, Montreal, QC, Canada, September 30 - Oct. 3, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-3051-0},
}