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STAMP S&S: Safety & Security Scenario for Specification and Standard in the society of AI/IoT

Tomoko Kaneko, Nobukazu Yoshioka, Ryôichi Sasaki. STAMP S&S: Safety & Security Scenario for Specification and Standard in the society of AI/IoT. In 20th IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2020, Macau, China, December 11-14, 2020. pages 168-175, IEEE, 2020. [doi]

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Tomoko Kaneko

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Nobukazu Yoshioka

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Ryôichi Sasaki

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