Tomoko Kaneko, Nobukazu Yoshioka, Ryôichi Sasaki. STAMP S&S: Safety & Security Scenario for Specification and Standard in the society of AI/IoT. In 20th IEEE International Conference on Software Quality, Reliability and Security Companion, QRS Companion 2020, Macau, China, December 11-14, 2020. pages 168-175, IEEE, 2020. [doi]
Abstract is missing.