Seong-Won Kang, Jung-Hoon Chun, Young-Hyun Jun, Kee-Won Kwon. A study on accelerated built-in self test of multi-Gb/s high speed interfaces. In Proceedings of the 2nd IEEE International Conference on Networked Embedded Systems for Enterprise Applications, NESEA 2011, Perth, Australia, December 8-9, 2011. pages 1-4, IEEE, 2011. [doi]
Abstract is missing.