Yesung Kang, Jaehyouk Choi, Youngmin Kim. A Wide-Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology Node. IEEE Trans. on Circuits and Systems, 62-II(9):846-850, 2015. [doi]
@article{KangCK15-1,
title = {A Wide-Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology Node},
author = {Yesung Kang and Jaehyouk Choi and Youngmin Kim},
year = {2015},
doi = {10.1109/TCSII.2015.2435672},
url = {http://dx.doi.org/10.1109/TCSII.2015.2435672},
researchr = {https://researchr.org/publication/KangCK15-1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {62-II},
number = {9},
pages = {846-850},
}