A Wide-Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology Node

Yesung Kang, Jaehyouk Choi, Youngmin Kim. A Wide-Range On-Chip Leakage Sensor Using a Current-Frequency Converting Technique in 65-nm Technology Node. IEEE Trans. on Circuits and Systems, 62-II(9):846-850, 2015. [doi]

Abstract

Abstract is missing.