Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell

No-Weon Kang, Jin-Seob Kang, Dae-Chan Kim, Jeong Hwan Kim, Joo-Gwang Lee. Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell. IEEE T. Instrumentation and Measurement, 58(4):1109-1113, 2009. [doi]

Authors

No-Weon Kang

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Jin-Seob Kang

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Dae-Chan Kim

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Jeong Hwan Kim

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Joo-Gwang Lee

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