Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell

No-Weon Kang, Jin-Seob Kang, Dae-Chan Kim, Jeong Hwan Kim, Joo-Gwang Lee. Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell. IEEE T. Instrumentation and Measurement, 58(4):1109-1113, 2009. [doi]

Abstract

Abstract is missing.