A Design and Test Technique for Embedded Software

Byeongdo Kang, Young-Jik Kwon, Roger Y. Lee. A Design and Test Technique for Embedded Software. In Third ACIS International Conference on Software Engineering, Research, Management and Applications (SERA 2005), 11-13 August 2005, Mt. Pleasant, MI, USA. pages 160-165, IEEE Computer Society, 2005. [doi]

Authors

Byeongdo Kang

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Young-Jik Kwon

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Roger Y. Lee

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