Byeongdo Kang, Young-Jik Kwon, Roger Y. Lee. A Design and Test Technique for Embedded Software. In Third ACIS International Conference on Software Engineering, Research, Management and Applications (SERA 2005), 11-13 August 2005, Mt. Pleasant, MI, USA. pages 160-165, IEEE Computer Society, 2005. [doi]
@inproceedings{KangKL05:1,
title = {A Design and Test Technique for Embedded Software},
author = {Byeongdo Kang and Young-Jik Kwon and Roger Y. Lee},
year = {2005},
doi = {10.1109/SERA.2005.6},
url = {http://doi.ieeecomputersociety.org/10.1109/SERA.2005.6},
tags = {embedded software, testing, design},
researchr = {https://researchr.org/publication/KangKL05%3A1},
cites = {0},
citedby = {0},
pages = {160-165},
booktitle = {Third ACIS International Conference on Software Engineering, Research, Management and Applications (SERA 2005), 11-13 August 2005, Mt. Pleasant, MI, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2297-1},
}