Sungwon Kang, Jihyun Lee, Myungchul Kim, Woojin Lee. Towards a Formal Framework for Product Line Test Development. In Seventh International Conference on Computer and Information Technology (CIT 2007), October 16-19, 2007, University of Aizu, Fukushima, Japan. pages 921-926, IEEE Computer Society, 2007. [doi]
Abstract is missing.