Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang. A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. IEEE Transactions on Reliability, 64(2):586-595, 2015. [doi]
@article{KangLLK15,
title = {A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories},
author = {Wooheon Kang and Changwook Lee and Hyunyul Lim and Sungho Kang},
year = {2015},
doi = {10.1109/TR.2015.2410274},
url = {http://dx.doi.org/10.1109/TR.2015.2410274},
researchr = {https://researchr.org/publication/KangLLK15},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {64},
number = {2},
pages = {586-595},
}