A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories

Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang. A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. IEEE Transactions on Reliability, 64(2):586-595, 2015. [doi]

Abstract

Abstract is missing.