Lifetime estimation for optocouplers using accelerated degradation test

Minkoo Kang, Sunjae Lee, Heedo Park, Joongsoon Jang, Sang C. Park, Jong-Ho Kim, Chan-Sei Yoo. Lifetime estimation for optocouplers using accelerated degradation test. Quality and Reliability Eng. Int., 38(1):560-573, 2022. [doi]

Abstract

Abstract is missing.