Deokyoung Kang, Hae-na Lee, Suk I. Yoo. Detecting defects in repeatedly patterned image with spatially different level of noise. In 2014 IEEE International Conference on Image Processing, ICIP 2014, Paris, France, October 27-30, 2014. pages 3258-3262, IEEE, 2014. [doi]
Abstract is missing.