Low-Complexity Double-Node-Upset Resilient Latch Design Using Novel Stacked Cross-Coupled Elements - researchr publication authors

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Young-Min Kang, Jung-Jin Park, Geon-Hak Kim, Ik Joon Chang, Jinsang Kim. Low-Complexity Double-Node-Upset Resilient Latch Design Using Novel Stacked Cross-Coupled Elements. IEEE Trans. Circuits Syst. II Express Briefs, 70(9):3619-3623, September 2023. [doi]

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