Young-Min Kang, Jung-Jin Park, Geon-Hak Kim, Ik Joon Chang, Jinsang Kim. Low-Complexity Double-Node-Upset Resilient Latch Design Using Novel Stacked Cross-Coupled Elements. IEEE Trans. Circuits Syst. II Express Briefs, 70(9):3619-3623, September 2023. [doi]
@article{KangPKCK23,
title = {Low-Complexity Double-Node-Upset Resilient Latch Design Using Novel Stacked Cross-Coupled Elements},
author = {Young-Min Kang and Jung-Jin Park and Geon-Hak Kim and Ik Joon Chang and Jinsang Kim},
year = {2023},
month = {September},
doi = {10.1109/TCSII.2023.3266489},
url = {https://doi.org/10.1109/TCSII.2023.3266489},
researchr = {https://researchr.org/publication/KangPKCK23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. II Express Briefs},
volume = {70},
number = {9},
pages = {3619-3623},
}