Wang Kang, Weisheng Zhao, Zhaohao Wang, Yue Zhang, Jacques-Olivier Klein, Youguang Zhang, Claude Chappert, Dafine Ravelosona. A low-cost built-in error correction circuit design for STT-MRAM reliability improvement. Microelectronics Reliability, 53(9-11):1224-1229, 2013. [doi]
@article{KangZWZKZCR13,
title = {A low-cost built-in error correction circuit design for STT-MRAM reliability improvement},
author = {Wang Kang and Weisheng Zhao and Zhaohao Wang and Yue Zhang and Jacques-Olivier Klein and Youguang Zhang and Claude Chappert and Dafine Ravelosona},
year = {2013},
doi = {10.1016/j.microrel.2013.07.036},
url = {http://dx.doi.org/10.1016/j.microrel.2013.07.036},
researchr = {https://researchr.org/publication/KangZWZKZCR13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {9-11},
pages = {1224-1229},
}