Wang Kang, Weisheng Zhao, Zhaohao Wang, Yue Zhang, Jacques-Olivier Klein, Youguang Zhang, Claude Chappert, Dafine Ravelosona. A low-cost built-in error correction circuit design for STT-MRAM reliability improvement. Microelectronics Reliability, 53(9-11):1224-1229, 2013. [doi]
Abstract is missing.