Wang Kang, Liuyang Zhang, Weisheng Zhao, Jacques-Olivier Klein, Youguang Zhang, Dafine Ravelosona, Claude Chappert. Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM. IEEE J. Emerg. Sel. Topics Circuits Syst., 5(1):28-39, 2015. [doi]
@article{KangZZKZRC15,
title = {Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM},
author = {Wang Kang and Liuyang Zhang and Weisheng Zhao and Jacques-Olivier Klein and Youguang Zhang and Dafine Ravelosona and Claude Chappert},
year = {2015},
doi = {10.1109/JETCAS.2014.2374291},
url = {http://dx.doi.org/10.1109/JETCAS.2014.2374291},
researchr = {https://researchr.org/publication/KangZZKZRC15},
cites = {0},
citedby = {0},
journal = {IEEE J. Emerg. Sel. Topics Circuits Syst.},
volume = {5},
number = {1},
pages = {28-39},
}