Rouwaida Kanj, Rajiv V. Joshi. A novel sample reuse methodology for fast statistical simulations with applications to manufacturing variability. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 672-678, IEEE, 2012. [doi]
Abstract is missing.