Rouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif. Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 33-40, IEEE Computer Society, 2007. [doi]
Abstract is missing.