Automatic diagnostic tool for Analog-Mixed Signal and RF load boards

Sukeshwar Kannan, Bruce C. Kim. Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]

Authors

Sukeshwar Kannan

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Bruce C. Kim

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