Sachhidh Kannan, Naghmeh Karimi, Ramesh Karri, Ozgur Sinanoglu. Modeling, Detection, and Diagnosis of Faults in Multilevel Memristor Memories. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(5):822-834, 2015. [doi]
@article{KannanKKS15,
title = {Modeling, Detection, and Diagnosis of Faults in Multilevel Memristor Memories},
author = {Sachhidh Kannan and Naghmeh Karimi and Ramesh Karri and Ozgur Sinanoglu},
year = {2015},
doi = {10.1109/TCAD.2015.2394434},
url = {http://dx.doi.org/10.1109/TCAD.2015.2394434},
researchr = {https://researchr.org/publication/KannanKKS15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {34},
number = {5},
pages = {822-834},
}