Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme - researchr publication authors

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Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force. Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electronic Testing, 27(3):241-252, 2011. [doi]

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