Kalyana R. Kantipudi. On the Size and Generation of Minimal N-Detection Tests. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 425-430, IEEE Computer Society, 2006. [doi]
@inproceedings{Kantipudi06,
title = {On the Size and Generation of Minimal N-Detection Tests},
author = {Kalyana R. Kantipudi},
year = {2006},
doi = {10.1109/VLSID.2006.125},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2006.125},
tags = {testing},
researchr = {https://researchr.org/publication/Kantipudi06},
cites = {0},
citedby = {0},
pages = {425-430},
booktitle = {19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2502-4},
}