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The Devil is in the Details: Whole Slide Image Acquisition and Processing for Artifacts Detection, Color Variation, and Data Augmentation: A Review

Neel Kanwal, Fernando Pérez-Bueno, Arne Schmidt 0005, Kjersti Engan, Rafael Molina 0001. The Devil is in the Details: Whole Slide Image Acquisition and Processing for Artifacts Detection, Color Variation, and Data Augmentation: A Review. IEEE Access, 10:58821-58844, 2022. [doi]

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Neel Kanwal

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Fernando Pérez-Bueno

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Arne Schmidt 0005

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Kjersti Engan

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Rafael Molina 0001

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