Neel Kanwal, Fernando Pérez-Bueno, Arne Schmidt 0005, Kjersti Engan, Rafael Molina 0001. The Devil is in the Details: Whole Slide Image Acquisition and Processing for Artifacts Detection, Color Variation, and Data Augmentation: A Review. IEEE Access, 10:58821-58844, 2022. [doi]
@article{KanwalPSEM22,
title = {The Devil is in the Details: Whole Slide Image Acquisition and Processing for Artifacts Detection, Color Variation, and Data Augmentation: A Review},
author = {Neel Kanwal and Fernando Pérez-Bueno and Arne Schmidt 0005 and Kjersti Engan and Rafael Molina 0001},
year = {2022},
doi = {10.1109/ACCESS.2022.3176091},
url = {https://doi.org/10.1109/ACCESS.2022.3176091},
researchr = {https://researchr.org/publication/KanwalPSEM22},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {10},
pages = {58821-58844},
}