Measurement of Layer Thickness and Permittivity Using a New Multilayer Model From GPR Data

Chien-Ping Kao, Jing Li, Ying Wang, Huichun Xing, Ce Richard Liu. Measurement of Layer Thickness and Permittivity Using a New Multilayer Model From GPR Data. IEEE T. Geoscience and Remote Sensing, 45(8):2463-2470, 2007. [doi]

Abstract

Abstract is missing.