Scott F. Kaplan. Complete or fast reference trace collection for simulating multiprogrammed workloads: choose one. In Edward G. Coffman Jr., Zhen Liu, Arif Merchant, editors, Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA. pages 420-421, ACM, 2004. [doi]
Abstract is missing.