Rohit Kapur. Security vs. Test Quality: Are they mutually exclusive?. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 1414, IEEE, 2004. [doi]
@inproceedings{Kapur04, title = {Security vs. Test Quality: Are they mutually exclusive?}, author = {Rohit Kapur}, year = {2004}, doi = {10.1109/ITC.2004.158}, url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.158}, tags = {testing, security}, researchr = {https://researchr.org/publication/Kapur04}, cites = {0}, citedby = {0}, pages = {1414}, booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA}, publisher = {IEEE}, isbn = {0-7803-8581-0}, }