Rohit Kapur, Thomas W. Williams. Tester retargetable patterns. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 721-727, IEEE Computer Society, 2001.
@inproceedings{KapurW01,
title = {Tester retargetable patterns},
author = {Rohit Kapur and Thomas W. Williams},
year = {2001},
researchr = {https://researchr.org/publication/KapurW01},
cites = {0},
citedby = {0},
pages = {721-727},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}