BitFlipScope: Scalable Fault Localization and Recovery for Bit-Flip Corruptions in LLMs

Muhammad Zeeshan Karamat, Sadman Saif, Christiana Chamon. BitFlipScope: Scalable Fault Localization and Recovery for Bit-Flip Corruptions in LLMs. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2026, Washington, DC, USA, May 4-7, 2026. pages 367-382, IEEE, 2026. [doi]

Abstract

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