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Studying the Relation between Anti-Patterns in Design Models and in Source Code

Bilal Karasneh, Michel R. V. Chaudron, Foutse Khomh, Yann-Gaël Guéhéneuc. Studying the Relation between Anti-Patterns in Design Models and in Source Code. In IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering, SANER 2016, Suita, Osaka, Japan, March 14-18, 2016. pages 36-45, IEEE, 2016. [doi]

Authors

Bilal Karasneh

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Michel R. V. Chaudron

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Foutse Khomh

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Yann-Gaël Guéhéneuc

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