Bilal Karasneh, Michel R. V. Chaudron, Foutse Khomh, Yann-Gaël Guéhéneuc. Studying the Relation between Anti-Patterns in Design Models and in Source Code. In IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering, SANER 2016, Suita, Osaka, Japan, March 14-18, 2016. pages 36-45, IEEE, 2016. [doi]
@inproceedings{KarasnehCKG16,
title = {Studying the Relation between Anti-Patterns in Design Models and in Source Code},
author = {Bilal Karasneh and Michel R. V. Chaudron and Foutse Khomh and Yann-Gaël Guéhéneuc},
year = {2016},
doi = {10.1109/SANER.2016.104},
url = {http://doi.ieeecomputersociety.org/10.1109/SANER.2016.104},
researchr = {https://researchr.org/publication/KarasnehCKG16},
cites = {0},
citedby = {0},
pages = {36-45},
booktitle = {IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering, SANER 2016, Suita, Osaka, Japan, March 14-18, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1855-0},
}