Cathy Kardach, I. Kapilevich, Jeffrey A. Block, Ted Lundquist, Steven Kasapi, J. Liao, Yin S. Ng, Bruce Cory. Foundry workflow for dynamic-EFA-based yield ramp. Microelectronics Reliability, 51(9-11):1668-1672, 2011. [doi]
@article{KardachKBLKLNC11,
title = {Foundry workflow for dynamic-EFA-based yield ramp},
author = {Cathy Kardach and I. Kapilevich and Jeffrey A. Block and Ted Lundquist and Steven Kasapi and J. Liao and Yin S. Ng and Bruce Cory},
year = {2011},
doi = {10.1016/j.microrel.2011.07.079},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.079},
researchr = {https://researchr.org/publication/KardachKBLKLNC11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1668-1672},
}