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Cathy Kardach, I. Kapilevich, Jeffrey A. Block, Ted Lundquist, Steven Kasapi, J. Liao, Yin S. Ng, Bruce Cory. Foundry workflow for dynamic-EFA-based yield ramp. Microelectronics Reliability, 51(9-11):1668-1672, 2011. [doi]
Abstract is missing.